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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/async/KhocheB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ajay_Khoche>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Brunvand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FWCADM.1995.514653>
foaf:homepage <https://doi.org/10.1109/WCADM.1995.514653>
dc:identifier DBLP conf/async/KhocheB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FWCADM.1995.514653 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Testing self-timed circuits using partial scan. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ajay_Khoche>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Brunvand>
swrc:pages 160-169 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/async/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/async/KhocheB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/async/KhocheB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/async/async1995.html#KhocheB95>
rdfs:seeAlso <https://doi.org/10.1109/WCADM.1995.514653>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/async>
dc:subject asynchronous circuits; logic testing; sequential circuits; self-timed circuits; partial scan; sequential network; data paths; partial scan environment (xsd:string)
dc:title Testing self-timed circuits using partial scan. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document