High-level test evaluation of asynchronous circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/async/Wiel95>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Rik_van_de_Wiel>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FWCADM.1995.514643>
foaf:homepage	<https://doi.org/10.1109/WCADM.1995.514643>
dc:identifier	DBLP conf/async/Wiel95 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FWCADM.1995.514643 (xsd:string)
dcterms:issued	1995 (xsd:gYear)
rdfs:label	High-level test evaluation of asynchronous circuits. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Rik_van_de_Wiel>
swrc:pages	63-71 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/async/1995>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/async/Wiel95/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/async/Wiel95>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/async/async1995.html#Wiel95>
rdfs:seeAlso	<https://doi.org/10.1109/WCADM.1995.514643>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/async>
dc:subject	asynchronous circuits; logic testing; VLSI; error detection codes; asynchronous circuits; high-level test evaluation; production fault tests; fault model; high-level circuit description; asynchronous 22 k transistor DCC error corrector IC (xsd:string)
dc:title	High-level test evaluation of asynchronous circuits. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document