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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/AainBD95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._H._Bratt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._P._Dorey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abu_Khari_bin_A%27Ain>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485328>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485328>
dc:identifier DBLP conf/ats/AainBD95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485328 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label On the development of power supply voltage control testing technique for analogue circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._H._Bratt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._P._Dorey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abu_Khari_bin_A%27Ain>
swrc:pages 133-139 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/AainBD95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/AainBD95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#AainBD95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485328>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject fault diagnosis; power supply circuits; voltage control; integrated circuit testing; analogue integrated circuits; circuit analysis computing; data analysis; operational amplifiers; power supply voltage control testing; analogue circuits; operational amplifier; simulation; IC tests; data analysis; hard defects; soft defects (xsd:string)
dc:title On the development of power supply voltage control testing technique for analogue circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document