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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/Al-ArsG00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893638>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893638>
dc:identifier DBLP conf/ats/Al-ArsG00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893638 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Impact of memory cell array bridges on the faulty behavior in embedded DRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:pages 282-289 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/Al-ArsG00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/Al-ArsG00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#Al-ArsG00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893638>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject random-access storage; integrated memory circuits; fault simulation; circuit simulation; memory cell array bridges; faulty behavior; embedded DRAMs; functional faults; memory tests; fault primitives; memory fault models; dynamic faulty behavior; dynamic RAM (xsd:string)
dc:title Impact of memory cell array bridges on the faulty behavior in embedded DRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document