An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ats/Altaf-Ul-AminD98>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Md._Altaf-Ul-Amin>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Zahari_Mohamed_Darus>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741632>
foaf:homepage	<https://doi.org/10.1109/ATS.1998.741632>
dc:identifier	DBLP conf/ats/Altaf-Ul-AminD98 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FATS.1998.741632 (xsd:string)
dcterms:issued	1998 (xsd:gYear)
rdfs:label	An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Md._Altaf-Ul-Amin>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Zahari_Mohamed_Darus>
swrc:pages	318-322 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ats/1998>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ats/Altaf-Ul-AminD98/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ats/Altaf-Ul-AminD98>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ats/ats1998.html#Altaf-Ul-AminD98>
rdfs:seeAlso	<https://doi.org/10.1109/ATS.1998.741632>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title	An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document