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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/AntonioliINK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Nishikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsuneo_Inufushi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yann_Antonioli>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893649>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893649>
dc:identifier DBLP conf/ats/AntonioliINK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893649 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A high-speed IDDQ sensor implementation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Nishikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsuneo_Inufushi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yann_Antonioli>
swrc:pages 356-361 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/AntonioliINK00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/AntonioliINK00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#AntonioliINK00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893649>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject integrated circuit testing; electric sensing devices; electric current measurement; circuit feedback; CMOS digital integrated circuits; high-speed IDDQ sensor implementation; submicron CMOS process; feedback scheme; floppy-disk controller IDDQ test; current sensor; BICS; built-in sensor; 0.35 micron; 50 MHz (xsd:string)
dc:title A high-speed IDDQ sensor implementation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document