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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/BagweP00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ameet_Bagwe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893635>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893635>
dc:identifier DBLP conf/ats/BagweP00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893635 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ameet_Bagwe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
swrc:pages 260- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/BagweP00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/BagweP00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#BagweP00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893635>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject logic testing; fault diagnosis; application specific integrated circuits; integrated circuit testing; digital signal processing chips; functional testing; fault analysis; fault coverage enhancement; embedded core based systems; test constraints; Texas Instruments TMS320C27xx; memory wrapper logic (xsd:string)
dc:title Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document