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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/BalakrishnanC95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arun_Balakrishnan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485346>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485346>
dc:identifier DBLP conf/ats/BalakrishnanC95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485346 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Software transformations for sequential test generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arun_Balakrishnan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
swrc:pages 266- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/BalakrishnanC95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/BalakrishnanC95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#BalakrishnanC95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485346>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject logic testing; sequential circuits; software engineering; design for testability; timing; sequential test generation; software transformations; high fault coverage test sets; software model; testability properties; inverse mapping; sequential circuits; DFT (xsd:string)
dc:title Software transformations for sequential test generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document