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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/BiswasG95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gosta_Pada_Biswas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Idranil_Sen_Gupta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485355>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485355>
dc:identifier DBLP conf/ats/BiswasG95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485355 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Generalized modular design of testable m-out-of-n code checker. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gosta_Pada_Biswas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Idranil_Sen_Gupta>
swrc:pages 322-326 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/BiswasG95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/BiswasG95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#BiswasG95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485355>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject cellular automata; combinational circuits; fault diagnosis; logic testing; logic arrays; fault location; VLSI; modular design; testable m-out-of-n code checker; cellular automaton; combinational logic port; initial state; iterative array; combinational logic cells; stuck-at faults; unidirectional faults; complementary outputs (xsd:string)
dc:title Generalized modular design of testable m-out-of-n code checker. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document