[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/BiswasSJMPS05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amit_Patra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dipankar_Sarkar_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Srikanth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Jha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Santosh_Biswas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siddhartha_Mukhopadhyay>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2005.85>
foaf:homepage <https://doi.org/10.1109/ATS.2005.85>
dc:identifier DBLP conf/ats/BiswasSJMPS05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2005.85 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amit_Patra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dipankar_Sarkar_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Srikanth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Jha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Santosh_Biswas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siddhartha_Mukhopadhyay>
swrc:pages 88-93 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/BiswasSJMPS05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/BiswasSJMPS05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2005.html#BiswasSJMPS05>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2005.85>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document