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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/ChaG11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae_Chul_Cha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2011.71>
foaf:homepage <https://doi.org/10.1109/ATS.2011.71>
dc:identifier DBLP conf/ats/ChaG11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2011.71 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae_Chul_Cha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:pages 126-135 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/ChaG11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/ChaG11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ChaG11>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2011.71>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document