On the capability of delay tests to detect bridges and opens. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ats/Chakravarty97>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643976>
foaf:homepage	<https://doi.org/10.1109/ATS.1997.643976>
dc:identifier	DBLP conf/ats/Chakravarty97 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FATS.1997.643976 (xsd:string)
dcterms:issued	1997 (xsd:gYear)
rdfs:label	On the capability of delay tests to detect bridges and opens. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
swrc:pages	314-319 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ats/Chakravarty97/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ats/Chakravarty97>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ats/ats1997.html#Chakravarty97>
rdfs:seeAlso	<https://doi.org/10.1109/ATS.1997.643976>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject	integrated circuit testing; delay tests; simulation; at-speed testing; defective IC; bridges; opens; faulty dynamic logic behavior; path delay tests; transition tests (xsd:string)
dc:title	On the capability of delay tests to detect bridges and opens. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document