Test generation for crosstalk-induced faults: framework and computational result.
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Test generation for crosstalk-induced faults: framework and computational result.
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crosstalk; automatic test pattern generation; combinational circuits; integrated logic circuits; integrated circuit testing; vectors; circuit analysis computing; 2-vector test generation; crosstalk-induced faults; technology scaling; clock frequency; noise effects; design effort; debugging effort; circuit performance; pulses; signal speedup; signal slowdown; digital combinational circuits; mixed-signal test generator; XGEN; static values; dynamic signals; transitions; timing information; signal arrival times; rise times; fall times; gate delay; SPICE simulations; accuracy
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Test generation for crosstalk-induced faults: framework and computational result.
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