Computing stress tests for interconnect defects. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ats/DabholkarC97>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Vinay_Dabholkar>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643950>
foaf:homepage	<https://doi.org/10.1109/ATS.1997.643950>
dc:identifier	DBLP conf/ats/DabholkarC97 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FATS.1997.643950 (xsd:string)
dcterms:issued	1997 (xsd:gYear)
rdfs:label	Computing stress tests for interconnect defects. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Vinay_Dabholkar>
swrc:pages	143-148 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ats/DabholkarC97/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ats/DabholkarC97>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ats/ats1997.html#DabholkarC97>
rdfs:seeAlso	<https://doi.org/10.1109/ATS.1997.643950>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject	integrated circuit testing; stress tests; interconnect defects; reliability screens; infant mortality; gate-oxide defects (xsd:string)
dc:title	Computing stress tests for interconnect defects. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document