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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/DarusAA97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Iftekhar_Ahmed_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liakot_Ali>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zahari_M._Darus>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643952>
foaf:homepage <https://doi.org/10.1109/ATS.1997.643952>
dc:identifier DBLP conf/ats/DarusAA97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1997.643952 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label A test processor chip implementing multiple seed, multiple polynomial linear feedback shift register. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Iftekhar_Ahmed_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liakot_Ali>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zahari_M._Darus>
swrc:pages 155- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/DarusAA97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/DarusAA97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1997.html#DarusAA97>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1997.643952>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject shift registers; test processor chip; multiple seed; multiple polynomial linear feedback shift register; ASIC chip; pattern generator; fault coverage; scan-path testing; external IC tester; simulation (xsd:string)
dc:title A test processor chip implementing multiple seed, multiple polynomial linear feedback shift register. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document