[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/DeS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhabani_P._Sinha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mallika_De>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485365>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485365>
dc:identifier DBLP conf/ats/DeS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485365 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Testing of a parallel ternary multiplier using I2L logic. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhabani_P._Sinha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mallika_De>
swrc:pages 387- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/DeS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/DeS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#DeS95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485365>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject multivalued logic circuits; fault location; integrated injection logic; multiplying circuits; fault diagnosis; logic testing; logic design; design for testability; adders; digital arithmetic; parallel ternary multiplier; I/sup 2/L logic; generalized model; multivalued I/sup 2/L circuits; test sets; parallel multiplier; input balanced ternary full adder; precarry generator; multivalued current inputs; multivalued current outputs; generated test sets; stuck-at fault; skew fault; adder (xsd:string)
dc:title Testing of a parallel ternary multiplier using I2L logic. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document