[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/DworakGCWWM00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brad_Cobb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jennifer_Dworak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li-C._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_R._Grimaila>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ting-Chi_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893618>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893618>
dc:identifier DBLP conf/ats/DworakGCWWM00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893618 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brad_Cobb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jennifer_Dworak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li-C._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_R._Grimaila>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ting-Chi_Wang>
swrc:pages 151- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/DworakGCWWM00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/DworakGCWWM00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#DworakGCWWM00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893618>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject circuit simulation; integrated logic circuits; integrated circuit testing; automatic test pattern generation; fault simulation; DO-RE-ME technique; MPG-D model; ATPG; defective part level prediction; benchmark circuit simulations; stuck-at fault detection tests; bridging surrogate detection; correlation coefficient; stuck-at fault coverage; logic circuit; predictor accuracy; industrial circuit; test pattern sequences (xsd:string)
dc:title On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document