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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/FlottesLP00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Petitqueux>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893657>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893657>
dc:identifier DBLP conf/ats/FlottesLP00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893657 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Petitqueux>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes>
swrc:pages 404- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/FlottesLP00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/FlottesLP00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#FlottesLP00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893657>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject sequential circuits; logic design; logic testing; design for testability; fault diagnosis; controllability; automatic test pattern generation; observability; sequential testability; internal state reseeding; fault coverage; observation points; flip-flops; partial reset; minimum DFT insertion; non-scan approach; at-speed testing; controllability; benchmark circuits; fault efficiency; ATPG; CPU time; 100 percent (xsd:string)
dc:title Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document