Design for sequential testability: an internal state reseeding approach for 100 % fault coverage.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/FlottesLP00
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/FlottesLP00
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/A._Petitqueux
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893657
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.2000.893657
>
dc:
identifier
DBLP conf/ats/FlottesLP00
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.2000.893657
(xsd:string)
dcterms:
issued
2000
(xsd:gYear)
rdfs:
label
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/A._Petitqueux
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marie-Lise_Flottes
>
swrc:
pages
404-
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/FlottesLP00/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/FlottesLP00
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats2000.html#FlottesLP00
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.2000.893657
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
subject
sequential circuits; logic design; logic testing; design for testability; fault diagnosis; controllability; automatic test pattern generation; observability; sequential testability; internal state reseeding; fault coverage; observation points; flip-flops; partial reset; minimum DFT insertion; non-scan approach; at-speed testing; controllability; benchmark circuits; fault efficiency; ATPG; CPU time; 100 percent
(xsd:string)
dc:
title
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document