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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/Franklin95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manoj_Franklin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485350>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485350>
dc:identifier DBLP conf/ats/Franklin95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485350 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Fast computation of C-MISR signatures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manoj_Franklin>
swrc:pages 293-297 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/Franklin95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/Franklin95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#Franklin95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485350>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject cellular automata; shift registers; logic testing; sequential circuits; built-in self test; equivalent circuits; VLSI; integrated circuit testing; C-MISR signatures; signature analyzers; test responses; built-in self-test applications; good circuit signature; faulty circuit signatures; cellular automata-based multi-input signature registers; equivalent single input circuit (xsd:string)
dc:title Fast computation of C-MISR signatures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document