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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/FukuiNF12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junichi_Fuse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Munetoshi_Fukui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasuhiko_Nara>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2012.80>
foaf:homepage <https://doi.org/10.1109/ATS.2012.80>
dc:identifier DBLP conf/ats/FukuiNF12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2012.80 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junichi_Fuse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Munetoshi_Fukui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasuhiko_Nara>
swrc:pages 4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/FukuiNF12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/FukuiNF12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2012.html#FukuiNF12>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2012.80>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document