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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HashizumeYITT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masashi_Takeda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893647>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893647>
dc:identifier DBLP conf/ats/HashizumeYITT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893647 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label High speed IDDQ test and its testability for process variation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masashi_Takeda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
swrc:pages 344-349 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HashizumeYITT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HashizumeYITT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#HashizumeYITT00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893647>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject integrated circuit testing; logic testing; production testing; CMOS logic circuits; high speed IDDQ test; testability; process variation; charge current; gate load capacitances; test input vector application; CMOS IC production (xsd:string)
dc:title High speed IDDQ test and its testability for process variation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document