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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HigamiKK95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485333>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485333>
dc:identifier DBLP conf/ats/HigamiKK95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485333 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Test sequence compaction by reduced scan shift and retiming. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
swrc:pages 169-175 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HigamiKK95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HigamiKK95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#HigamiKK95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485333>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject logic testing; sequential circuits; design for testability; timing; flip-flops; logic CAD; computational complexity; test sequence compaction; reduced scan shift; retiming; full scan designed circuits; flip-flops; test length; computing time; sequential circuit; test sequence generation; transformation (xsd:string)
dc:title Test sequence compaction by reduced scan shift and retiming. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document