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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HigamiSK98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741631>
foaf:homepage <https://doi.org/10.1109/ATS.1998.741631>
dc:identifier DBLP conf/ats/HigamiSK98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1998.741631 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
swrc:pages 312-317 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1998>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1998.html#HigamiSK98>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1998.741631>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document