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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HigamiSTKT07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shin-ya_Kobayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2007.64>
foaf:homepage <https://doi.org/10.1109/ATS.2007.64>
dc:identifier DBLP conf/ats/HigamiSTKT07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2007.64 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shin-ya_Kobayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 271-274 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HigamiSTKT07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HigamiSTKT07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2007.html#HigamiSTKT07>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2007.64>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document