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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HigamiTK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893620>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893620>
dc:identifier DBLP conf/ats/HigamiTK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893620 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Test sequence compaction for sequential circuits with reset states. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 165-170 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HigamiTK00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HigamiTK00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#HigamiTK00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893620>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject sequential circuits; logic testing; fault simulation; signal detection; logic simulation; vectors; automatic test pattern generation; test sequence compaction; sequential circuits; reset states; test compaction method; single stuck-at fault assumption; unremovable vectors; fault-dropping fault simulation; nonfault-dropping fault simulation; test vectors; reset signal; fault detection; logic simulation; test subsequences; benchmark circuits (xsd:string)
dc:title Test sequence compaction for sequential circuits with reset states. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document