A Partial Scan Design Method Based on n-Fold Line-up Structures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/HosokawaHOMK97
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A Partial Scan Design Method Based on n-Fold Line-up Structures.
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partial scan, n-fold line-up structure, dynamic test sequence compaction, flip-flop of load/hold type, fault efficiency, state justification
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A Partial Scan Design Method Based on n-Fold Line-up Structures.
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