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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HsuW96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-Ching_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1996.555137>
foaf:homepage <https://doi.org/10.1109/ATS.1996.555137>
dc:identifier DBLP conf/ats/HsuW96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1996.555137 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Testing And Diagnosis Of Board Interconnects In Microprocessor-Based Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-Ching_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
swrc:pages 56-61 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HsuW96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HsuW96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1996.html#HsuW96>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1996.555137>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject printed circuit testing; testing; diagnosis; hierarchical testing; microprocessor; multiple-board system; printed circuit board; bus emulator; fault detection; wiring interconnect (xsd:string)
dc:title Testing And Diagnosis Of Board Interconnects In Microprocessor-Based Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document