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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HuangHL97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min-Cheng_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643987>
foaf:homepage <https://doi.org/10.1109/ATS.1997.643987>
dc:identifier DBLP conf/ats/HuangHL97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1997.643987 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Built-in current sensor designs based on the bulk-driven technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min-Cheng_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
swrc:pages 384- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HuangHL97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HuangHL97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1997.html#HuangHL97>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1997.643987>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject electric current measurement; built-in current sensor; bulk-driven current mirror; biasing schemes; simplicity; accuracy; flexibility; low power dissipation; power supply voltage drop; circuit speed degradation; external power supply; area overhead; I/sub DDQ/ testing; 0.3 V; 0.3 ns (xsd:string)
dc:title Built-in current sensor designs based on the bulk-driven technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document