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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HuangJ00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Der-Cheng_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893640>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893640>
dc:identifier DBLP conf/ats/HuangJ00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893640 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label An efficient parallel transparent diagnostic BIST. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Der-Cheng_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
swrc:pages 299- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HuangJ00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HuangJ00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#HuangJ00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893640>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject built-in self test; integrated memory circuits; integrated circuit testing; fault diagnosis; parallel algorithms; automatic testing; logic testing; VLSI; parallel transparent diagnostic BIST; built-in self-diagnosis method; multiple embedded memory arrays; transparent diagnostic interface; redundant read/write/shift operations; march algorithm; TDiagRSMarch algorithm; low hardware overhead; test time reduction; test coverage; diagnostic efficiency (xsd:string)
dc:title An efficient parallel transparent diagnostic BIST. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document