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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/HuangL99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1999.810769>
foaf:homepage <https://doi.org/10.1109/ATS.1999.810769>
dc:identifier DBLP conf/ats/HuangL99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1999.810769 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label An Input Control Technique for Power Reduction in Scan Circuits During Test Application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
swrc:pages 315-320 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/HuangL99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/HuangL99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1999.html#HuangL99>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1999.810769>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject Low-power Test, Full-scan, Power Minimization, ATPG, VLSI testing (xsd:string)
dc:title An Input Control Technique for Power Reduction in Scan Circuits During Test Application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document