[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/InoueFMYO95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Michinishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuji_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tokumi_Yokohira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485345>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485345>
dc:identifier DBLP conf/ats/InoueFMYO95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485345 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Universal test complexity of field-programmable gate arrays. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Michinishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuji_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tokumi_Yokohira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
swrc:pages 259-265 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/InoueFMYO95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/InoueFMYO95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#InoueFMYO95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485345>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject field programmable gate arrays; fault diagnosis; logic testing; table lookup; automatic test software; logic CAD; design for testability; computational complexity; field-programmable gate array; universal test complexity; arbitrary logic circuits; look-up tables; sequential loading; random access loading; programming schemes; block-sliced loading; C-testable; configuration memory cells; fault model (xsd:string)
dc:title Universal test complexity of field-programmable gate arrays. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document