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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/InoueGF00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emil_Gizdarski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893656>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893656>
dc:identifier DBLP conf/ats/InoueGF00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893656 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A class of sequential circuits with combinational test generation complexity under single-fault assumption. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emil_Gizdarski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
swrc:pages 398-403 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/InoueGF00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/InoueGF00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#InoueGF00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893656>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject logic testing; fault diagnosis; sequential circuits; combinational circuits; automatic test pattern generation; sequential circuits; combinational test generation complexity; single-fault; single stuck-at-faults; internally balanced structures; combinational test generation; separable primary inputs; multiple stuck-at faults; test sequence; undetectability (xsd:string)
dc:title A class of sequential circuits with combinational test generation complexity under single-fault assumption. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document