Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/ItazakiMMK98
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/ItazakiMMK98
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fumiro_Matsuki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Noriyoshi_Itazaki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yasuyuki_Matsumoto
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741624
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.1998.741624
>
dc:
identifier
DBLP conf/ats/ItazakiMMK98
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.1998.741624
(xsd:string)
dcterms:
issued
1998
(xsd:gYear)
rdfs:
label
Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fumiro_Matsuki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Noriyoshi_Itazaki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yasuyuki_Matsumoto
>
swrc:
pages
272-277
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/1998
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/ItazakiMMK98/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/ItazakiMMK98
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats1998.html#ItazakiMMK98
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.1998.741624
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
title
Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document