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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/JahangiriMCMP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jay_Jahangiri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ron_Press>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subramanian_Mahadevan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2005.19>
foaf:homepage <https://doi.org/10.1109/ATS.2005.19>
dc:identifier DBLP conf/ats/JahangiriMCMP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2005.19 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Achieving High Test Quality with Reduced Pin Count Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jay_Jahangiri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ron_Press>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subramanian_Mahadevan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
swrc:pages 312-317 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/JahangiriMCMP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/JahangiriMCMP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2005.html#JahangiriMCMP05>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2005.19>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Achieving High Test Quality with Reduced Pin Count Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document