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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/JhajhariaW95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hua_Swee_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhir_K._Jhajharia>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485335>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485335>
dc:identifier DBLP conf/ats/JhajhariaW95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485335 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Training diploma students on ATE-related module. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hua_Swee_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhir_K._Jhajharia>
swrc:pages 184- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/JhajhariaW95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/JhajhariaW95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#JhajhariaW95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485335>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject automatic test equipment; automatic testing; training; integrated circuit testing; electronic equipment testing; teaching; electronic engineering education; printed circuit testing; educational courses; tertiary institution; ATE-related module; diploma students; final year students; Microelectronics option; Electronics and Communication Engineering Department; Singapore Polytechnic; teaching; assessment; Singapore Polytechnic Education Model; automated test equipment; Advanced Diploma; test patterns; printed circuit boards; practical training; industry-standard; laboratory session (xsd:string)
dc:title Training diploma students on ATE-related module. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document