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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/Jou95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Yang_Jou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485351>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485351>
dc:identifier DBLP conf/ats/Jou95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485351 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label An effective BIST design for PLA. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Yang_Jou>
swrc:pages 286-292 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/Jou95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/Jou95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#Jou95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485351>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject built-in self test; programmable logic arrays; integrated circuit testing; automatic testing; combinational circuits; logic testing; CMOS logic circuits; BIST design; PLA; deterministic test pattern generator; cross point; AND array; multiple input signature register; characteristic polynomial; fault detection capability; stuck-at fault model; contact fault model (xsd:string)
dc:title An effective BIST design for PLA. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document