On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/KajiharaMK99
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On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits.
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On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits.
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