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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/KaoWC00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chin-Te_Kao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sam_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893665>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893665>
dc:identifier DBLP conf/ats/KaoWC00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893665 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A case study of failure analysis and guardband determination for a 64M-bit DRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chin-Te_Kao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sam_Wu>
swrc:pages 447- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/KaoWC00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/KaoWC00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#KaoWC00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893665>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject DRAM chips; integrated circuit testing; failure analysis; integrated circuit yield; integrated circuit economics; failure analysis; guardband determination; DRAM; prevention strategy; test derivation; yield; product quality; test cost; test selection; 64 Mbit (xsd:string)
dc:title A case study of failure analysis and guardband determination for a 64M-bit DRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document