[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/KondoC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kondo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1996.555156>
foaf:homepage <https://doi.org/10.1109/ATS.1996.555156>
dc:identifier DBLP conf/ats/KondoC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1996.555156 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label An Efficient Compact Test Generator for IDDQ Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kondo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
swrc:pages 177-182 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/KondoC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/KondoC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1996.html#KondoC96>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1996.555156>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject IDDQ, Selective IDDQ, ATPG, Pattern Compaction, Fault Model, Leakage Fault, Pseudo Stuck-at Fault, Essential Fault, Testability, Test (xsd:string)
dc:title An Efficient Compact Test Generator for IDDQ Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document