Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/KonijnenburgLG99
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1999
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Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
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ATPG, sequential circuit TPG, cost estimates, back-jumping, conflict-directed backtrack, three-state (tri-state) circuit TPG
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Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
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