A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/KuangXY08
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A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.
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A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.
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