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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/KuchiiHT96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshimasa_Kuchii>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1996.555155>
foaf:homepage <https://doi.org/10.1109/ATS.1996.555155>
dc:identifier DBLP conf/ats/KuchiiHT96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1996.555155 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshimasa_Kuchii>
swrc:pages 171-176 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/KuchiiHT96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/KuchiiHT96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1996.html#KuchiiHT96>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1996.555155>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject IDDQ testing, supply current testing, test generation, PODEM, D-frontier (xsd:string)
dc:title Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document