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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/KunduEPB05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2005.83>
foaf:homepage <https://doi.org/10.1109/ATS.2005.83>
dc:identifier DBLP conf/ats/KunduEPB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2005.83 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
swrc:pages 266-271 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/KunduEPB05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/KunduEPB05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2005.html#KunduEPB05>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2005.83>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject Temperature testing, Low-voltage testing,Resistive defects, Early-life failures (xsd:string)
dc:title On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document