[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/KungHL95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Pin_Kung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Shang_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Jieh_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485322>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485322>
dc:identifier DBLP conf/ats/KungHL95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485322 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Fast fault simulation for BIST applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Pin_Kung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Shang_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Jieh_Huang>
swrc:pages 93-99 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/KungHL95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/KungHL95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#KungHL95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485322>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject built-in self test; combinational circuits; logic testing; digital simulation; circuit analysis computing; VLSI; integrated circuit testing; signature computation; BIST applications; combinational fault simulation; test patterns; BISTSIM; demand-driven logic simulation algorithm; fault propagation methods; MISR; aliasing; bit-array computation; parallel-pattern sequential simulation; speedup ratio; VLSI (xsd:string)
dc:title Fast fault simulation for BIST applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document