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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LeeH00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-I_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893633>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893633>
dc:identifier DBLP conf/ats/LeeH00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893633 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label A hierarchical test control architecture for core based design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-I_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
swrc:pages 248-253 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LeeH00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LeeH00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LeeH00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893633>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject application specific integrated circuits; integrated circuit testing; design for testability; automatic testing; IEEE standards; hierarchical test control architecture; core based design; SOC design; IEEE P1500 Working Group; test standard; test architecture; IEEE 1149.1 cores; parallel testing capabilities; hierarchical test control mechanism; deeply embedded cores; hierarchical test access (xsd:string)
dc:title A hierarchical test control architecture for core based design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document