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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LeeHC00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jih-Jeen_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893666>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893666>
dc:identifier DBLP conf/ats/LeeHC00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893666 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Peak-power reduction for multiple-scan circuits during test application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jih-Jeen_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
swrc:pages 453-458 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LeeHC00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LeeHC00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LeeHC00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893666>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject logic testing; boundary scan testing; delays; application specific integrated circuits; integrated circuit testing; peak-power reduction; logic testing; multiple scan chain based circuits; peak periodicity; peak width; power waveforms; scan-based circuits; delay buffers; interleaving scan technique; data output; SOC (xsd:string)
dc:title Peak-power reduction for multiple-scan circuits during test application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document