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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LentzMC95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_C._Czeck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elias_S._Manolakos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karen_Panetta_Lentz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485321>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485321>
dc:identifier DBLP conf/ats/LentzMC95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485321 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label On the simulation of Multiple Stuck-at Faults using Multiple Domain Concurrent and Comparative Simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_C._Czeck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elias_S._Manolakos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karen_Panetta_Lentz>
swrc:pages 86-92 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LentzMC95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LentzMC95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#LentzMC95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485321>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject fault diagnosis; logic testing; circuit analysis computing; discrete event simulation; concurrent engineering; fault location; multiple stuck-at fault simulation; multiple domain simulation; comparative simulation; MDCCS; discrete event concurrent simulation; CPU time efficiency; digital logic fault simulation (xsd:string)
dc:title On the simulation of Multiple Stuck-at Faults using Multiple Domain Concurrent and Comparative Simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document