An RT-Level ATPG Based on Clustering of Circuit States.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/LiML01
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2001
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An RT-Level ATPG Based on Clustering of Circuit States.
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automatic test pattern generation, register-transfer level, behavioral descriptions, cluster of states
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An RT-Level ATPG Based on Clustering of Circuit States.
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