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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LiangLC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsing-Chung_Liang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1996.555128>
foaf:homepage <https://doi.org/10.1109/ATS.1996.555128>
dc:identifier DBLP conf/ats/LiangLC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1996.555128 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Invalid State Identification for Sequential Circuit Test Generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsing-Chung_Liang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
swrc:pages 10-15 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LiangLC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LiangLC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1996.html#LiangLC96>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1996.555128>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject sequential circuits, invalid states, test generation (xsd:string)
dc:title Invalid State Identification for Sequential Circuit Test Generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document