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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LiuM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485362>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485362>
dc:identifier DBLP conf/ats/LiuM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485362 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Power supply current detectability of SRAM defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
swrc:pages 367- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LiuM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LiuM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#LiuM95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485362>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject SRAM chips; fault diagnosis; short-circuit currents; fault currents; leakage currents; power supply circuits; electric current measurement; transients; power supply current detectability; SRAM defects; SRAM cell; power supply current; I/sub DDQ/; quiescent power supply current; i/sub DDT/; transient power supply current; shorts; open defects; disturb-type pattern sensitivity; total current leakage; SRAM size; simulation; current detectability; physical defect; large circuit effects (xsd:string)
dc:title Power supply current detectability of SRAM defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document